Mixed-gas species plasma source system
AssigneeFEI Company
InventorsDavid Levi, Kevin Kagarice, Daniel Totonjian
Life of this patent
Estimating the term…
Loading patent…
AssigneeFEI Company
InventorsDavid Levi, Kevin Kagarice, Daniel Totonjian
Estimating the term…
An ion beam system including a plasma source tube defining a plasma source chamber, a first gas reservoir housing a first gas, a second gas reservoir housing a second gas, a first controller fluidly coupled to the first gas reservoir and configured to control a first flow rate of the first gas, and a second controller fluidly coupled to the second gas reservoir and configured to control a second flow rate of the second gas. The system also includes a first capillary constriction including a first end fluidly coupled to the first controller and a second end fluidly coupled to the plasma source chamber, and a second capillary constriction including a third end fluidly coupled to the second controller and a fourth end fluidly coupled to the plasma source chamber, where the first capillary constriction and the second capillary constriction are distinct.
A method of controlling an ion beam generated from a plasma source chamber of an ion beam system, the method comprising:
An ion beam system comprising:
A non-transitory computer-readable medium storing instructions that, when executed by one or more processors, cause an ion beam system to:
Dependencies are inferred from the claim text.