Electronic device smart ram built in self test
OwnerVishal Diwan, Mihir Narendra Mody +2inventors
InventorsVishal Diwan, Mihir Narendra Mody, Malav Shah, Rakesh Y C
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Abstract
An electronic device includes a processor, a memory having a first memory bank and a second memory bank, and a device identifier stored in the electronic device and readable by the processor to identify a non-faulty one of the memory banks of the memory. A method includes testing a first memory bank and a second memory bank of a memory in an electronic device, determining a faulty one of the memory banks of the memory and a non-faulty one of the memory banks of the memory, and storing a device identifier in the electronic device that identifies the non-faulty one of the memory banks of the memory.
Claims20
An electronic device, comprising:
- a processor;
- a memory having a first memory bank and a second memory bank;
- and
- a device identifier stored in the electronic device and readable by the processor to identify a non-faulty one of the memory banks of the memory.
A method, comprising:
- testing a first memory bank and a second memory bank of a memory in an electronic device;
- determining a faulty one of the memory banks of the memory and a non-faulty one of the memory banks of the memory;
- and
- storing a device identifier in the electronic device that identifies the non-faulty one of the memory banks of the memory.
A system, comprising:
- a memory having a first memory bank and a second memory bank in an electronic device;
- and
- a processor configured to:
- test the first memory bank and the second memory bank;
- determine a faulty one of the memory banks of the memory and a non-faulty one of the memory banks of the memory;
- and
- store a device identifier in the electronic device that identifies the non-faulty one of the memory banks of the memory.
Dependencies are inferred from the claim text.