Methods and systems for identification and tracing of radiation detector structures
AssigneeRedlen Technologies, Inc.
InventorsNiloofar SADEGHI, Sanjay RAJGURU, Krzysztof INIEWSKI
Life of this patent
Estimating the term…
Abstract
A method of generating an identifier for a radiation detector structure including an application specific integrated circuit (ASIC) includes performing a calibration process to determine threshold voltage offsets for a plurality of analog to digital converters (ADCs) in respective signal processing channels of the ASIC, generating the identifier for at least one of the ASIC or the radiation detector structure based on the threshold voltage offsets of the plurality of ADCs, and storing the identifier.
Claims20
A method of generating an identifier for a radiation detector structure including an application specific integrated circuit (ASIC), comprising:
- performing a calibration process to determine threshold voltage offsets for a plurality of analog to digital converters (ADCs) in respective signal processing channels of the ASIC;
- generating the identifier for at least one of the ASIC or the radiation detector structure based on the threshold voltage offsets of the plurality of ADCs;
- and
- storing the identifier.
A radiation detector structure, comprising
- at least one radiation sensor comprising an array of pixel detectors;
- an application specific integrated circuit (ASIC) comprising a plurality of signal processing channels, wherein:
- each of the signal processing channels contains an analog to digital converter (ADC), the plurality of signal processing channels of the ASIC are electrically coupled to respective pixel detectors of the array of pixel detectors, and each signal processing channel is configured to generate photon count data for a respective pixel detector of the array of pixel detectors;
- and
- a storage device configured to store an identifier for the radiation detector structure, wherein the identifier is generated by performing a calibration process to determine threshold voltage offsets for a plurality of the ADCs in the respective signal processing channels of the ASIC, and generating the identifier for at least one of the ASIC or the radiation detector structure based on the threshold voltage offsets of the plurality of ADCs.
Dependencies are inferred from the claim text.