Control device of flaw detection device and quality management support method
AssigneeMitsubishi Heavy Industries, Ltd.
InventorsTakayuki MATSUMOTO, Makoto ISHIDA
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Heavy Industries, Ltd.
InventorsTakayuki MATSUMOTO, Makoto ISHIDA
Estimating the term…
A control device of a flaw detection device uses, as a control target, a flaw detection device provided with a probe and a robot arm that presses the probe against an inspection object. The control device executes tracing processing, learning processing, and inspection processing. In the tracing processing, the probe is moved along the inspection object while being brought into contact with the inspection object by operating the robot arm. In the learning processing, the shape of the inspection object is learned according to the position of the probe for every movement thereof in the tracing processing. In the inspection processing, the inspection object is inspected by using the reflected wave of the ultrasonic wave transmitted while displacing the probe brought into contact with the inspection object according to the shape of the inspection object learned by the learning processing.
1-9. (canceled)
A control device of a flaw detection device including a probe, and a robot arm that presses the probe against an inspection target,
A control device of a flaw detection device including a probe, and a robot arm that presses the probe against an inspection target,
Dependencies are inferred from the claim text.