Condition prediction method, program, and device
AssigneesThe University of Osaka, Gc R&D Corporation
InventorsSatoshi YAMAGUCHI, Satoshi IMAZATO, Yusuke HOKII, Shigenori AKIYAMA, Yutaka SHINOZAKI
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Abstract
A method includes acquiring a property value of a material; predicting a feature of the material based on the acquired property value of the material by performing an inverse analysis on a model that predicts a property value of the material based on a feature of the material; generating a result of topological data analysis based on the predicted feature of the material; and presenting, on an image of a material different from the material, a pixel corresponding to a portion designated in the result of the topological data analysis.
Claims8
A method, comprising:
- acquiring a property value of a first material;
- predicting a feature of the first material based on the acquired property value of the first material by performing an inverse analysis on a model that predicts a property value of the first material based on a feature of the first material;
- generating a result of topological data analysis based on the predicted feature of the first material;
- and
- presenting, on an image of a second material different from the first material of the acquired property value, a pixel corresponding to a portion designated in the result of the topological data analysis.
A non-transitory computer-readable storage medium storing a program, which when executed, causes a computer to execute:
- acquiring a property value of a first material;
- predicting a feature of the first material based on the acquired property value of the first material by performing an inverse analysis on a model that predicts a property value of the first material based on a feature of the first material;
- generating a result of topological data analysis based on the predicted feature of the first material;
- and
- presenting, on an image of a second material different from the first material of the acquired property value, a pixel corresponding to a portion designated in the result of the topological data analysis.
A device, comprising:
- a memory;
- and
- a processor coupled to the memory, the processor being configured to:
- acquire a property value of a first material;
- predict a feature of the first material based on the acquired property value of the first material by performing an inverse analysis on a model that predicts a property value of the first material based on a feature of the first material;
- generate a result of topological data analysis based on the predicted feature of the first material;
- and
- present, on an image of a second material different from the first material of the acquired property value, a pixel corresponding to a portion designated in the result of the topological data analysis.
Dependencies are inferred from the claim text.