Charged Particle Beam Device
AssigneeHitachi High-Tech Corporation
InventorsTakashi KUBO, Minoru SAKAMAKI, Hiroshi MORITA
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AssigneeHitachi High-Tech Corporation
InventorsTakashi KUBO, Minoru SAKAMAKI, Hiroshi MORITA
Estimating the term…
An object of the present invention is to provide a charged particle beam device that includes an electrode short-circuit mechanism capable of suppressing a change in a lens effect generated between acceleration electrodes during a change in acceleration voltage and is operable while applying an acceleration voltage to the electrode short-circuit mechanism. In the charged particle beam device according to the present invention, while applying an acceleration voltage to a first acceleration electrode, a potential difference between a short-circuit electrode and a first multi-stage acceleration electrode is controlled such that discharge does not occur, and the first multi-stage acceleration electrode and the short-circuit electrode that have the above-described potential difference are connected to each other (refer to FIG. 1).
A charged particle beam device that irradiates a sample with a charged particle beam, the device comprising:
Dependencies are inferred from the claim text.