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US 2026/0260344 A1Published application
Imaging systems and methods useful for patterned structures
AssigneeSingular Genomics Systems, Inc.
InventorsFedor TRINTCHOUK, Eli N. GLEZER
Life of this patent
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Abstract
Disclosed herein, inter alia, are methods and systems of image analysis useful for identifying and/or quantifying features in patterns.
Claims18
-19. (canceled)
A method of imaging a solid support comprising a plurality of features, the method comprising:
- obtaining a plurality of images of the solid support using a detection apparatus comprising at least one camera;
- providing the plurality of images or image-related data to a computer;
- and executing the following on the computer:
- forming an extraction operator using a first image of the plurality of images, wherein the extraction operator is derived from a matrix describing image formation for the solid support;
- and
- for each subsequent image of the plurality of images, extracting feature intensities for the plurality of features using the extraction operator.
3 more elements
A method of imaging a solid support, the method comprising:
- obtaining a plurality of images of the solid support using a detection apparatus comprising at least one camera;
- providing the plurality of images or image-related data to a computer;
- and executing the following on the computer:
- (a) detecting one or more focusing beads in one image of the plurality of images and storing a bead map indicating focusing bead locations;
- (b) aligning the bead map to each image of the plurality of images;
- and
- (c) replacing pixels of each image of the plurality of images corresponding to the focusing bead locations with pixel values based on regions surrounding the focusing bead locations, thereby suppressing focusing bead signal in each image.
4 more elements
Dependencies are inferred from the claim text.