US 2026/0259282 A1 · ARRANGEMENT AND METHOD

Abstract

An arrangement includes a first contact arrangement including a first substrate, first primary contacts and two first test contacts, wherein the first primary contacts and the first test contacts are arranged on the first substrate; a second contact arrangement including a second substrate, second primary contacts and two second test contacts, wherein the second primary contacts and the second test contacts are arranged on the second substrate; an evaluation circuit which can be and/or is electrically coupled to the first test contacts and/or the second two test contacts; wherein the first contact arrangement and the second contact arrangement are mutually arrangeable in order to couple the first and the second primary contacts electrically to one another, wherein the evaluation circuit is configured to determine a coupling state of the primary contacts depending on contacting of the first and second test contacts with one another.

Claims16

Dependent claims

An arrangement comprising:

a first contact arrangement (110) comprising a first substrate (111), first primary contacts (112), and two first test contacts (113, 114), wherein the first primary contacts (112) and the first test contacts (113, 114) are arranged on the first substrate (111),
a second contact arrangement (120) comprising a second substrate (121), second primary contacts (122) and two second test contacts (123, 124), wherein the second primary contacts (122) and the second test contacts (123, 124) are arranged on the second substrate (121),
an evaluation circuit (150) that can be and/or is electrically coupled to the first test contacts (113, 114) and/or the second two test contacts (123, 124),
wherein the first contact arrangement (110) and the second contact arrangement (120) are arrangeable on one another in order to couple the first and the second primary contacts (113, 114, 123, 124) electrically to one another, wherein the evaluation circuit (150) is configured to determine a coupling state of the primary contacts (112, 122) depending on a contact between the first and second test contacts (113, 114, 123, 124).

1 more element

A method for determining a coupling state of a first contact arrangement (110) and a second contact arrangement (120), wherein the first contact arrangement (110) has a first substrate (111), first primary contacts (112) and two first test contacts (113, 114), wherein the first primary contacts (112) and the first test contacts (113, 114) are arranged on the first substrate (111), and wherein the second contact arrangement (120) has a second substrate (121), second primary contacts (122) and two second test contacts (123, 124), wherein the second primary contacts (122) and the second test contacts (123, 124) are arranged on the second substrate (121), the method comprising:

arranging the first and second contact arrangements (110, 120) on top of each other,
applying a test electrical current to at least one of the first and/or at least one of the second test contacts (113, 114, 123, 124),
detecting a contacting of the first and second test contacts (113, 114, 123, 124) with each other depending on a response to the test current,
determining the coupling state of the primary contacts depending on the contacting determined.

1 more element

Dependencies are inferred from the claim text.

Arrangement and method

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Arrangement and method

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Abstract

Claims16