Scan test in a single-wire bus circuit

Abstract

A Scan test in a single-wire bus circuit is described in the present disclosure. The single-wire bus circuit has one or more external pins for connecting to a single-wire bus. Given that multiple physical pins are required to carry out the Scan test, the single-wire bus circuit must provide additional pins required by the Scan test. In embodiments disclosed herein, the single-wire bus circuit includes a communication circuit under test and a driver circuit coupled to the communication circuit via multiple internal pins. The driver circuit uses a subset of the internal pins as input pins and another subset of the internal pins as output pins in order to carry out the Scan test in the communication circuit. A mini-telegram is sent at the beginning of the Scan test along with common bus values. This reduces the time required to perform the scan test.

Dependencies are inferred from the claim text.