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US 2026/0259180 A1Published application
Measurement uncertainty at acquisition instance for non-destructive testing
AssigneeEvident Scientific, Inc.
InventorJulia G. MacDougall
Life of this patent
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Abstract
Various devices and methods for non-destructive testing (NDT) are provided. For example, an NDT testing system may include a sensor for acquiring measurement data, a user interface, and a control circuit. The control circuit may obtain the measurement data and generate a measurement result and a measurement uncertainty contemporaneously with the acquisition. The user interface may display the measurement result and the measurement uncertainty.
Claims20
A method of non-destructive testing, comprising:
- acquiring, by a sensor of a non-destructive testing (NDT) device, measurement data comprising a series of N measurements at a test location of an object;
- displaying, by a user interface of the NDT device, a measurement result and a measurement uncertainty for the test location, wherein the measurement result and measurement uncertainty are displayed in real-time contemporaneously with the acquisition of the measurement data.
A non-destructive testing (NDT) system, comprising:
- a sensor configured to acquire measurement data for a test location of an object;
- a control circuit communicably coupled to the sensor, the control circuit configured to:
- obtain the measurement data from the sensor;
- process the N data acquisitions to derive N measurement values for the test location;
- determine a sample mean and a sample standard deviation from the N measurement values;
- and
- generate a measurement result and a measurement uncertainty for the test location based on the sample mean and the sample standard deviation;
- and
- a user interface configured to display the measurement result and the measurement uncertainty for the test location in real-time contemporaneously with the acquisition of the measurement data.
6 more elements
Dependencies are inferred from the claim text.