Inspection device
AssigneesMitsubishi Heavy Industries, Ltd., Riken
InventorsKeisuke KAJIKAWA, Jun YASUI, Soki AKUTSU, Hiroaki MINAMIDE
Life of this patent
Estimating the term…
Loading patent…
AssigneesMitsubishi Heavy Industries, Ltd., Riken
InventorsKeisuke KAJIKAWA, Jun YASUI, Soki AKUTSU, Hiroaki MINAMIDE
Estimating the term…
An inspection device is a device for inspecting an inner peripheral surface of an inspection target having a cylindrical shape. The device includes: an inspection part for emitting a terahertz wave to the inner peripheral surface and detecting a reflection wave of the terahertz wave; and a distance measurement part for measuring a distance between the inspection part and the inner peripheral surface. The inspection part and the distance measurement part are rotated along a circumferential direction of the inspection target. The axial-directional position of the inspection part relative to the inspection target is adjusted. The position of the inspection part on a plane which intersects with an axial direction of the inspection target is adjustable. The position adjustment mechanism is controlled such that a rotational center of the rotation part is positioned on a center axis of the inspection target on the basis of a measurement result of the distance measurement part.
An inspection device for inspecting an inner peripheral surface of an inspection target having a cylindrical shape, the inspection device comprising:
Dependencies are inferred from the claim text.