Test circuit and electro-optical device

A test circuit comprising:

• a first circuit including an amplifier having a first input node, a second input node, and an output node, a first switch having one end electrically coupled to the first input node and another end to which a first potential is applied, and a second switch having one end electrically coupled to the second input node and another end to which a second potential is applied;
• a second circuit including a first capacitive element provided between a test node and the first input node and having one end electrically coupled to the first input node, a third switch having one end electrically coupled to another end of the first capacitive element and another end electrically coupled to the test node, a second capacitive element having one end electrically coupled to the first input node, and a fourth switch having one end electrically coupled to another end of the second capacitive element and another end electrically coupled to the test node;
• and
• a control circuit controlling the first circuit and the second circuit, wherein
• a withstand voltage of the amplifier is lower than a voltage applied to the test node, and
• a capacitance of the second capacitive element is smaller than a capacitance of the first capacitive element.