Method and device for analyzing samples
AssigneeElectronics and Telecommunications Research Institute
InventorsHyowoong NOH, Dae-Sik LEE, Junyeong LEE, Byeongju LEE
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AssigneeElectronics and Telecommunications Research Institute
InventorsHyowoong NOH, Dae-Sik LEE, Junyeong LEE, Byeongju LEE
Estimating the term…
A sample analysis device is provided. The sample analysis device includes a sample tray on which a sample is placed, a measurement unit configured to measure the sample based on light emitted from the sample or transmitted through the sample, and a processing unit configured to analyze the sample based on the light. The measurement unit includes a first light source configured to emit first light, a second light source configured to emit second light, and a sensor configured to sense third light and fourth light, wherein the third light is fluorescence emitted after being excited by the first light incident on the sample, and wherein the fourth light is generated by the second light being transmitted through the sample. The light includes the third light and the fourth light obtained from the sensor.
A sample analysis device comprising:
A method of analyzing a sample, performed by a sample analysis device, the method comprising:
Dependencies are inferred from the claim text.