Method for manufacturing semiconductor substrate, method for etching substrate, and composition for surface modification
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsEita SUGA, Tomoya KUMAGAI
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsEita SUGA, Tomoya KUMAGAI
Estimating the term…
Provided are a method for manufacturing a semiconductor substrate, a method for etching a substrate, and a composition for surface modification, the method for manufacturing a semiconductor substrate including: a step of dry-etching a substrate; and a step of treating the dry-etched substrate with a composition for surface modification, in which the composition for surface modification contains (A) a silane coupling agent represented by General Formula (1) and/or a derivative thereof; and (B) water: in General Formula (1), A and B each independently represent a hydrogen atom, a hydroxy group, a hydrocarbon group, or an organic group containing a nitrogen atom, and at least one of A and B represents a hydrogen atom; X and Y each independently represent an alkyl group, an alkoxy group, a hydrogen atom, a halogen atom, or a hydroxy group; Z represents an alkoxy group or a hydroxy group; and n represents a number.
A method for manufacturing a semiconductor substrate, the method comprising:
A method for etching a substrate, the method comprising:
A composition for surface modification of a substrate comprising a layer comprising a Low-k material, the composition comprising:
Dependencies are inferred from the claim text.