Processing system and measurement system

A processing system that processes an object, wherein

• the processing system comprises:
• a processing apparatus that is configured to process the object by irradiating the object with a processing beam;
• a measuring apparatus that is configured to measure a position of the object and that is configured to measure a position of the processing apparatus;
• and
• a control apparatus that is configured to control the processing apparatus,
• the processing apparatus includes:
• a first movement apparatus that is configured to change a position of a processing head that emits the processing beam;
• and
• a second movement apparatus on which the first movement apparatus is mounted and which is configured to move together with the first movement apparatus,
• the control apparatus controls a movement due to the second movement apparatus based on a measuring result by the measurement apparatus and model information related to a shape of the object.