Learning device, symmetry evaluation device, learning method, and recording medium
AssigneeNEC Corporation
InventorKoichi TAKAHASHI
Life of this patent
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AssigneeNEC Corporation
InventorKoichi TAKAHASHI
Estimating the term…
This learning device acquires training data that includes an original image; generates an inverted image in which the original image is axisymmetrically inverted; calculates the coordinates of feature points of the original image and the coordinates of feature points of the inverted image; calculates a symmetry evaluation value that indicates the degree of difference between the coordinates of the feature points of the original image and the coordinates of the feature points of the inverted image in a case where coordinate conversion is performed so as to cancel out the difference in coordinates between the coordinates of the feature points of the original image and the coordinates of the feature points of the inverted image due to the effect of image inversion; and controls the training of a model used for calculating the coordinates such that the degree of difference indicated by the symmetry evaluation value is reduced.
A learning device comprising:
(canceled)
A symmetry evaluation device comprising:
A learning method executed by a computer, the method comprising:
(canceled)
Dependencies are inferred from the claim text.