US 2026/0244170 A1 · EXPLAINABLE MODEL MONITORING

Abstract

AI systems can define industrial AI models that perform, for example and without limitation, pattern recognition, trend prediction, or deviation identification. Furthermore, embodiments can automatically identify immediate and responsive actions to the detected deviations, and can automatically verify whether the identified actions are successful. Without being bound by theory, but by way of example, in some cases, embodiments described herein enable operators to monitor AI applications and respond to deviations within minutes, whereas current approaches might require data scientists to monitor and respond, and such a response might take days.

Claims15

Dependent claims

A method performed by a computing system associated with an industrial system, the method comprising:

identifying a change that occurs in a manufacturing domain of the industrial system, the manufacturing domain defining machines, materials, or processes configured to perform operations or produce an output;
based on the change, selecting at least one Artificial Intelligence (AI) component in an AI domain, the AI domain configured to monitor the manufacturing domain, so as to define a mapping between the change in the manufacturing domain and the at least one AI component;
and
based on the mapping, determining a first root cause for the change and a second root cause for the change, first root cause corresponding to the manufacturing domain, and the second root cause associated with the AI domain.

1 more element

A computing system of an industrial system, the computing system comprising a processor and a memory storing instructions that, when executed by the processor, configured the system to:

identify a change that occurs in a manufacturing domain of the industrial system, the manufacturing domain defining machines, materials, or processes configured to perform operations or produce an output;
based on the change, select at least one Artificial Intelligence (AI) component in an AI domain, the AI domain configured to monitor the manufacturing domain, so as to define a mapping between the change in the manufacturing domain and the at least one AI component;
and
based on the mapping, determine a first root cause for the change and a second root cause for the change, first root cause corresponding to the manufacturing domain, and the second root cause associated with the AI domain.

1 more element

Dependencies are inferred from the claim text.

Explainable model monitoring

Life of this patent

Explainable model monitoring

Life of this patent

Abstract

Claims15