System for determining optical probe location relative to a photonic integrated circuit
AssigneeKeysight Technologies, Inc.
InventorsChristopher Coleman, Ryan Scott
Life of this patent
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Abstract
A photonic integrated circuit (PIC) is disclosed, and includes a substrate, and a diffractive optical element (DOE), which is adapted to receive an input optical signal. The DOE is disposed over the substrate and includes surface relief patterns that define a reflective, diffractive focusing lens apertured to retroreflect and focus light back over a prescribed incidence angular range to a DOE-defined focal point located at a reference position above a surface of the PIC. The DOE reflects light of the input optical signal such that reflected optical irradiance is at a maximum when the input optical signal is incident from the reference position.
Claims20
A photonic integrated circuit (PIC) comprising:
- a substrate;
- and
- a diffractive optical element (DOE) adapted to receive an input optical signal, the DOE being disposed over the substrate and comprising surface relief patterns that define a reflective, diffractive focusing lens apertured to retroreflect and focus light back over a prescribed incidence angular range to a DOE-defined focal point located at a reference position above a surface of the PIC, wherein the DOE reflects light of the input optical signal such that reflected optical irradiance is at a maximum when the input optical signal is incident from the reference position.
Dependencies are inferred from the claim text.