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AssigneeHitachi High-Tech Corporation
InventorsHiroki NAKAMURA, Hiroaki NITTA, Takaaki HAGIWARA
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When an unanalyzable abnormality occurs in a certain specimen and a predetermined condition is satisfied, analyzable specimens can be analyzed even when a setting of collecting a rack loaded with the specimen is enabled. An automatic analysis device performs a preset first control or a second control. The first control is for, when a dispensing abnormality occurred in the specimen, continuing analysis scheduled for other specimens in the rack that carries the specimen container containing the specimen. The second control is for, when a dispensing abnormality occurred in the specimen, canceling analysis scheduled for other specimens in the rack that carries the specimen container containing the specimen and transporting the rack to the rack storage portion by the transport mechanism. The automatic analysis device performs the first control when a dispensing abnormality occurs in the specimen while the second control is set and a predetermined condition is satisfied.
An automatic analysis device comprising:
An automatic analysis method using an automatic analysis device including, a transport mechanism that transports a rack carrying a plurality of specimen containers containing specimens to be analyzed to a dispensing mechanism,
Dependencies are inferred from the claim text.