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AssigneeAbberior Instruments GmbH
InventorsAndreas SCHONLE, Joachim FISCHER
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A light microscopy method including illuminating a sample with focused pulsed excitation light to excite at least two types of emitters with different emission lifetimes to emit light, and illuminating the sample with an intensity distribution of inhibition light comprising a local minimum to de-excite emitters outside the local minimum, detecting photons emitted from the sample by a detector, performing a phasor analysis based on the detected photons to separate photons from the different types of emitters based on their emission lifetimes, and performing a gating of the photons, wherein respective gating time intervals are provided for excitation pulses of the excitation light, and wherein only those photons detected in the respective gating time interval are taken into account in the phasor analysis, as well as a light microscopy device and a computer program for carrying out the method.
A light microscopy method, wherein a sample is illuminated with focused pulsed excitation light to excite at least two types of emitters with different emission lifetimes to emit light, wherein the sample is additionally illuminated with an intensity distribution of inhibition light comprising a local minimum to de-excite emitters outside the local minimum, wherein photons emitted from the sample are detected by a detector, wherein a phasor analysis is performed based on the detected photons to separate photons from the different types of emitters based on their emission lifetime,
A light microscopy device comprising at least the following components:
Dependencies are inferred from the claim text.