System
AssigneeSysmex Corporation
InventorsTsukasa NAKAMURA, Takashi KARINO
Life of this patent
Estimating the term…
Loading patent…
AssigneeSysmex Corporation
InventorsTsukasa NAKAMURA, Takashi KARINO
Estimating the term…
Provided is a specimen measurement system operable to optically perform a measurement on a specimen, including: a specimen analyzer configured to optically perform the measurement on the specimen, including: (i) a specimen suction part configured to suction the specimen, the specimen suction part including a nozzle to suction the specimen in a specimen container, a movement mechanism configured to move the nozzle into the specimen container and a pump configured to apply a negative pressure so that the nozzle suctions the specimen; (ii) a sample preparator configured to prepare a measurement sample by mixing the suctioned specimen and a reagent in a container; (iii) an optical detector configured to detect light from the prepared measurement sample; and (iv) a controller configured to control, according to control software, the specimen suction part, the sample preparator and the optical detector so that the specimen analyzer optically performs the measurement on the specimen.
A specimen measurement system operable to optically perform a measurement on a specimen, the specimen measurement system comprising:
Dependencies are inferred from the claim text.