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AssigneeORONTEC GmbH & Co. KG
InventorsKarl-Friedrich DOESSEL, Ralph Jan WOERHEIDE, Hans Hendrik HUSTERT
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A method and a device for the thermographic characterization of the surface of a coated workpiece in which a thermogram is produced of one or more first surface portions of the surface, and an image is produced of one or more illuminated second surface portions of the surface, at least some of the one or more first and second surface portions extending over a common region of the surface. In addition to the spatial extent of an inhomogeneity in the layer structure determined using the thermogram, a height profile of the surface is also determined. To this end, the illuminated region of the surface, of which a thermogram and an image are created, is illuminated such that the image provides a height profile of the surface.
A method for the thermographic characterization of a surface (2) of a coated metal substrate (1) using a sensor (13), comprising generating a thermogram and an image of a region of the surface (2) of the coated metal substrate illuminated by an infrared laser (8) which produces a laser beam (9) with a wavelength which lies outside a sensitivity range of the sensor (13), wherein the region is illuminated in a manner such that the image provides a height profile of the surface.
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Dependencies are inferred from the claim text.