Film formation method and film formation apparatus
AssigneeTokyo Electron Limited
InventorsYoshimasa WATANABE, Kota UMEZAWA, Katsutoshi ISHII
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AssigneeTokyo Electron Limited
InventorsYoshimasa WATANABE, Kota UMEZAWA, Katsutoshi ISHII
Estimating the term…
A film formation method of forming a film containing Si and O on a substrate, includes: supplying a Si-containing compound gas having a structural Formula (1) below to the substrate; and supplying an OH-containing gas to the substrate. The supplying the Si-containing compound gas and the supplying the OH-containing gas are alternately performed. R1 is a hydrogen atom, a linear or branched alkyl group having 1 to 4 carbon atoms, a linear or branched alkoxy group having 1 to 4 carbon atoms, a linear or branched alkylthio group having 1 to 4 carbon atoms, or an aryl group having 6 to 12 carbon atoms. Ring R2 is a heterocyclic ring containing a nitrogen atom, m is an integer of 1 to 5, n is an integer of 1 to 4, and the ring R2 is a 3- to 6-membered ring.
A film formation method of forming a film containing Si and O on a substrate, comprising:
A film formation apparatus, comprising:
Dependencies are inferred from the claim text.