Method for manufacturing semiconductor device
AssigneeKYOCERA Corporation
InventorsTakeshi KAMIKAWA, Yuta AOKI, Noboru SUDA, Hiroyuki OGURA, Fumio YAMASHITA, Kosuke MISHIMA, Tatsuo TADA
Life of this patent
Estimating the term…
Loading patent…
AssigneeKYOCERA Corporation
InventorsTakeshi KAMIKAWA, Yuta AOKI, Noboru SUDA, Hiroyuki OGURA, Fumio YAMASHITA, Kosuke MISHIMA, Tatsuo TADA
Estimating the term…
A method for manufacturing a semiconductor device from a semiconductor substrate, the semiconductor substrate comprising: a template substrate; a first semiconductor part being located above the template substrate and including a nitride semiconductor, wherein the first semiconductor part comprises a first initial wing portion including a N-polar surface facing an upper substrate of the template substrate through a void. The manufacturing method comprising introducing an etchant into the void, the etchant etching the N-polar surface of the first initial wing portion to form a first wing portion having a plurality of protrusions protruding toward the template substrate.
A method for manufacturing a semiconductor device from a semiconductor substrate,
Dependencies are inferred from the claim text.