Semiconductor device
AssigneeMinebea Power Semiconductor Device Inc.
InventorsMasaki SHIRAISHI, Masaki NAMAI, Tomoyasu FURUKAWA, Yujiro TAKEUCHI
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AssigneeMinebea Power Semiconductor Device Inc.
InventorsMasaki SHIRAISHI, Masaki NAMAI, Tomoyasu FURUKAWA, Yujiro TAKEUCHI
Estimating the term…
To prevent carriers from flowing to an IGBT from a diode on the same chip, the IGBT has a drift layer of a first conductivity type, and a body layer and a first contact layer of a second conductivity type. The first contact layer has an impurity concentration higher than that of the body layer. The diode has a first semiconductor layer and a second contact layer of the second conductivity type. The second contact layer has an impurity concentration higher than that of the first semiconductor layer. An area of the second contact layer of the diode in a boundary portion vicinity is smaller than an area of the second contact layer farther from the boundary portion vicinity. An area of the first contact layer of the IGBT in a boundary portion vicinity is smaller than an area of the first contact layer farther from the boundary portion vicinity.
A semiconductor device having an IGBT region and a diode region in the same chip,
Dependencies are inferred from the claim text.