Semiconductor structure and method for forming the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHong-Chih CHEN, Chun-Sheng LIANG, Jhon-Jhy LIAW, Fu-Hsiang SU
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsHong-Chih CHEN, Chun-Sheng LIANG, Jhon-Jhy LIAW, Fu-Hsiang SU
Estimating the term…
A method for forming a semiconductor structure is provided. The method includes forming an active region including a lower fin element and first semiconductor layers and second semiconductor layers alternately stacked over the lower fin element, forming a fin spacer layer along a sidewall of the active region, forming a dielectric wall over the fin spacer layer, forming a dummy gate structure over the active region, the fin spacer layer and the dielectric wall, and etching the active region, the fin spacer layer, and the first dielectric wall to form a first recess. The method also includes laterally recessing, from the first recess, the first semiconductor layers of the active region and the fin spacer layer to form a notch, forming an inner spacer layer in the notch, and forming a source/drain feature on the lower fin element of the active region.
A semiconductor structure, comprising:
A semiconductor structure, comprising:
A semiconductor structure, comprising:
Dependencies are inferred from the claim text.