Semiconductor device and method of manufacturing semiconductor device
AssigneeMitsubishi Electric Corporation
InventorsYusuke MIYATA, Kohei SAKO, Koji TANAKA, Naoyuki KAWABATA, Kazuya KONISHI
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AssigneeMitsubishi Electric Corporation
InventorsYusuke MIYATA, Kohei SAKO, Koji TANAKA, Naoyuki KAWABATA, Kazuya KONISHI
Estimating the term…
A semiconductor device includes a bipolar-type semiconductor element that includes a semiconductor substrate having a drift layer of a first conductivity type formed therein, trenches formed in a first main surface of the semiconductor substrate, an electrode embedded in each trench via an insulation film, a mesa region located between the trenches in the semiconductor substrate, and a source layer of a first conductivity type or a contact layer of a second conductivity type formed in a surface layer of the mesa region on the first main surface side. Dislocations having an overall length greater than the width of the mesa region are formed in positions located on the side closer to a second main surface than the source layer or the contact layer in the mesa region.
A semiconductor device comprising:
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.