Remote mapping of circuit speed variation due to process, voltage and temperature using a network of digital sensors

A method for identifying and mapping hotspots in a digital sensor network having a plurality of digital sensors within an area of an integrated circuit component of an integrated circuit, comprising:

• adjusting a first counter value of a first digital sensor of the plurality of digital sensors using a first calibration coefficient associated with the first digital sensor;
• adjusting a second counter value of a second digital sensor of the plurality of digital sensors using a second calibration coefficient associated with the second digital sensor;
• comparing a first plurality of counter values of the plurality of the digital sensors including the adjusted first counter value and the adjusted second counter value;
• identifying a counter value of a comparison of the first plurality of counter values as a critical counter value;
• and
• identifying a critical digital sensor associated with the critical counter value.

A method for identifying a hotspot in a digital sensor network, the method comprising:

• adjusting a first counter value of a first digital sensor of a plurality of digital sensors;
• adjusting a second counter value of a second digital sensor of the plurality of digital sensors;
• performing a comparison of a plurality of counter values of the plurality of the digital sensors including the adjusted first counter value and the adjusted second counter value;
• and
• identifying a critical digital sensor based on the comparison.