Automated sample analysis system and methods of use thereof
AssigneePurdue Research Foundation
InventorsRobert Graham Cooks, Eric T. Dziekonski
Life of this patent
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AssigneePurdue Research Foundation
InventorsRobert Graham Cooks, Eric T. Dziekonski
Estimating the term…
The invention generally relates to an automated sample analysis system and methods of use thereof. In certain aspects, the invention provides an automated sample analysis system comprising: a desorption electrospray ionization (DESI) probe; a substrate for holding one or more samples; a mass spectrometer; and one or more controllers, wherein the one or more controllers are operably associated with each other and at least one of the DESI probe, the substrate, and/or the mass spectrometer, and the one or more controllers are each configured to execute one or more programs that cause acquisition of two-dimensional tandem mass spectrometry (2D-MS/MS) data domains via synchronous operation of the DESI probe with movement of the substrate along with the 2D-MS/MS data acquisition, thereby ensuring automated correct time and position for 2D-MS/MS data acquisition.
An automated sample analysis system comprising:
A method for automated sample analysis, the method comprising:
Dependencies are inferred from the claim text.