Memory devices and methods of manufacturing thereof
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsRyota Watanabe, Kazumasa Uno, Hidemitsu Kojima, Hiromasa Otsubo, Tai-Te Chu
Life of this patent
Estimating the term…
Loading patent…
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsRyota Watanabe, Kazumasa Uno, Hidemitsu Kojima, Hiromasa Otsubo, Tai-Te Chu
Estimating the term…
A circuit includes memory cells, each from one of first, second, third, or fourth cells. The first cell includes a transistor having a gate coupled to a first wordline, a first source/drain coupled to a first interconnect carrying a ground voltage, and a second source/drain coupled to the first interconnect. The second cell includes a transistor having a gate coupled to a second wordline, a first source/drain coupled to a second interconnect configured as a bitline, and a second source/drain coupled to the second interconnect. The third cell includes a transistor having a gate coupled to a third wordline, a first source/drain coupled to the first interconnect, and a second source/drain coupled to the second interconnect. The fourth cell includes a transistor having a gate coupled to a fourth wordline, a first source/drain coupled to the second interconnect, and a second source/drain coupled to the first interconnect.
A memory circuit, comprising:
A memory circuit, comprising:
A method for programming a memory circuit, comprising:
Dependencies are inferred from the claim text.