Method for short circuit inspection of secondary battery cell

Abstract

Disclosed herein is a method for short circuit inspection of a secondary battery cell which includes preparing a fully-packaged secondary battery cell, micro-charging the secondary battery cell to a state of charge (SOC) in a range of 0.03% to 0.05%, measuring an open-circuit voltage drop caused by a self-discharge of the micro-charged secondary battery cell, and determining the secondary battery cell as a defective product if a change rate per hour of the measured open-circuit voltage drop exceeds a predetermined reference value.

Dependencies are inferred from the claim text.