Testing device and its pogo probe device
AssigneesGlobal Unichip Corporation, Taiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-Chieh LIAO, Yu-Min SUN, Chih-Feng CHENG
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AssigneesGlobal Unichip Corporation, Taiwan Semiconductor Manufacturing Company, Ltd.
InventorsChih-Chieh LIAO, Yu-Min SUN, Chih-Feng CHENG
Estimating the term…
A pogo probe device provided includes a probe needle body, a compression spring and a plunger. The probe needle body is provided with a tubular channel therein. The compression spring is received within the tubular channel. The plunger includes a plunger body, a probe tip, an inclined surface and a scraping portion. The plunger body is slidably inserted into one end of the probe needle body to abut against the compression spring. The probe tip is located at one end of the plunger body opposite to the compression spring. The probe tip is located at another end of the plunger body opposite to the compression spring. The inclined surface is connected to the probe tip and an outer lateral side of the plunger body. The scraping portion includes a plurality of parallel sawtoothed rows arranged on the inclined surface along the inclined surface.
A pogo probe device, comprising:
A pogo probe device, comprising:
Dependencies are inferred from the claim text.