Scanning apparatus and method for determining grain structure in a component

A scanning apparatus for determining grain structure in a component, the scanning apparatus comprising:

• an imaging beam source configured to generate an imaging beam that passes through the component;
• an imaging beam receiver configured to receive the imaging beam, such that the component is disposed between the imaging beam source and the imaging beam receiver, wherein the imaging beam receiver is configured to generate one or more images in response to receiving the imaging beam;
• a support platform configured to support the component, wherein the imaging beam source and the imaging beam receiver are configured to rotate and/or revolve relative to the support platform about one or more axes to allow generation of the one or more images;
• and
• a processor communicably coupled to the imaging beam receiver and configured to:
• acquire, during the rotation and/or revolution, a plurality of projections each taken at the imaging beam receiver;
• perform reconstruction of first projections from the plurality of projections to obtain a first three-dimensional image of the component, the first projections being acquired in at least one first angular range of the rotation and/or revolution;
• perform reconstruction of second projections from the plurality of projections to obtain at least one second three-dimensional image of the component, the second projections being acquired in at least one second angular range of the rotation and/or revolution, wherein the at least one second angular range is different from the at least one first angular range;
• compare the first three-dimensional image and the at least one second three-dimensional image;
• and
• determine, based on the comparison, the grain structure in the component.

A method for determining a difference in grain orientation in a component by scanning the component in a scanning apparatus, the method comprising the steps of:

• disposing the component on a support platform of the scanning apparatus, such that the component is positioned between an imaging beam source and an imaging beam receiver of the scanning apparatus, wherein the imaging beam source and the imaging beam receiver are oppositely disposed to either side of the support platform;
• generating, by the imaging beam source, an imaging beam that passes through the component;
• rotating and/or revolving the imaging beam source and the imaging beam receiver relative to the support platform about one or more axes;
• acquiring, during the rotation and/or revolution, a plurality of projections each taken at the imaging beam receiver at different angles of rotation and/or revolution to produce a projection data set, the projection data set comprising collected data samples of imaging beam attenuation by the component;
• comparing, by a processor, the projection data set with a reference data set, wherein the reference data set comprises reference data samples of imaging beam attenuation by the component, wherein the reference data set is previously stored in a memory of the processor;
• and
• determining the difference in grain orientation in the component based on the comparison of the projection data set with the reference data set.