Retro-reflection measurement method and device

Abstract

The present invention discloses a retro-reflection measurement method, including the following steps: S1: uniformly illuminating, by a directional light source, a measured sample, and receiving, by an array detector, retro-reflected light from the measured sample, to obtain retro-reflected light distribution; S2: calculating, based on the light distribution, a retro-reflection luminescence intensity that varies with an observation angle, including: enabling position coordinates of a pixel in the array detector to be corresponding to the observation angle of retro-reflection, enabling a pixel response value of the array detector to be corresponding to the retro-reflection luminescence intensity, and then calculating a retro-reflection parameter of the measured sample at a specified observation angle. In the present invention, correspondences between a pixel, an angle, and a luminescence intensity are established, so that efficient conversion from light distribution data to a retro-reflection parameter is implemented.

Dependencies are inferred from the claim text.