Method and system for modifying a photonic chip having a semiconductor waveguide

A system for modifying a photonic chip having a semiconductor waveguide, the semiconductor waveguide having a bandgap wavelength, the system comprising:

• a corrective laser apparatus configured for directing a focal point of a corrective laser beam within a portion of the photonic chip being one of proximate to and within the semiconductor waveguide, the corrective laser beam having a central wavelength greater than the bandgap wavelength of the semiconductor waveguide, said directing modifying an effective refractive index of the semiconductor waveguide;
• a photonic chip testing apparatus performing a testing routine on the semiconductor waveguide including determining a parameter indicative of a performance of the semiconductor waveguide;
• and
• a controller communicatively coupled to the corrective laser apparatus and to the photonic chip testing apparatus, the controller having a processor and a memory having stored thereon instructions that when executed by the processor perform the steps of:
• comparing said parameter to a reference parameter associated with a reference photonic chip;
• and
• upon determining that said parameter mismatches the reference parameter, repeating said directing and said testing routine until said parameter matches the reference parameter within a given tolerance.

A method of testing a photonic chip, the photonic chip having a semiconductor waveguide and a plurality of semiconductor components optically coupled to the semiconductor waveguide, the semiconductor components having a bandgap wavelength, the method comprising:

• while performing a testing routine on the semiconductor waveguide, the testing routine including guiding a test optical signal into and along the semiconductor waveguide, detecting an output signal resulting from said guiding and monitoring an output signal based on said output signal, directing a focal point of a probing laser beam within a portion of the photonic chip being one of proximate to and within one of the plurality of semiconductor components, the corrective laser beam having a central wavelength greater than the bandgap wavelength of the semiconductor components, said directing modifying an effective refractive index of the portion of the one of the semiconductor components;
• identifying an optical feature in the output spectrum being modified in response to said directing;
• and
• associating the optical feature to the one of the semiconductor components.