Low temperature flowable vanadium oxide gap fill
AssigneeASM IP Holding B.V.
InventorsEric James Shero, Charles Dezelah, Ren-Jie Chang, Qi Xie, Perttu Sippola, Petri Raisanen
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AssigneeASM IP Holding B.V.
InventorsEric James Shero, Charles Dezelah, Ren-Jie Chang, Qi Xie, Perttu Sippola, Petri Raisanen
Estimating the term…
Vapor deposition methods and related systems are provided for depositing layers comprising vanadium and oxygen. In some embodiments, the methods comprise contacting a substrate in a reaction space with alternating pulses of a vapor-phase vanadium precursor and a vapor-phase oxygen reactant. The reaction space may be purged, for example, with an inert gas, between reactant pulses. The methods may be used to fill a gap on a substrate surface. Reaction conditions, including deposition temperature and reactant pulse and purge times may be selected to achieve advantageous gap fill properties. In some embodiments, the substrate on which deposition takes place is maintained at a relatively low temperature, for example between about 50° C. and about 185° C.
A method of depositing vanadium oxide on a substrate, comprising:
A method of filling a gap on a substrate in a reaction space with vanadium oxide, the method comprising a plurality of deposition cycles, comprising:
A method of forming a gap fill layer, comprising:
Dependencies are inferred from the claim text.