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US 2026/0233229 A1Published application
Examination device
AssigneeFUJIFILM Corporation
InventorsShunsuke NISHIMURA, Yuta TAKEUCHI, Takahiro MIYATO
Life of this patent
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Abstract
The examination device examines a specimen, in which a door that is openable and closable is disposed on a front surface of a housing, a working space having a stage on which the specimen is set is provided inside the door, and in an open position of the door, an upper end surface of the door and an upper surface of the stage are positioned on the same plane.
Claims10
An examination device that examines a specimen,
- wherein a door that is openable and closable is disposed on a front surface of a housing,
- a working space having a stage on which the specimen is set is provided inside the door, and
- in an open position of the door, an upper end surface of the door and an upper surface of the stage are positioned on the same plane.
Dependencies are inferred from the claim text.