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US 2026/0230720 A1Published application
Inspection system, information processing device, inspection method, and program
AssigneeSony Semiconductor Solutions Corporation
InventorsTatsuya Higashisaka, Satoshi Ihara, Takehiro Aoshima
Life of this patent
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Abstract
This inspection system includes: an event-based vision sensor that captures an image of an inspection object and detects changes in luminance for each pixel as an event; and a control unit that performs determination of defect presence in the inspection object on the basis of event data that is output from the event-based vision sensor according to the detected event.
Claims20
An inspection system comprising:
- an event-based vision sensor that captures an image of an inspection object and detects changes in luminance for each pixel as an event;
- and
- a control unit that performs determination of defect presence in the inspection object on a basis of event data that is output from the event-based vision sensor according to the event that has been detected.
An information processing device comprising:
- a control unit that performs determination of defect presence in an inspection object on a basis of event data output from an event-based vision sensor that captures an image of the inspection object and detects changes in luminance for each pixel as an event.
An inspection method comprising:
- performing, by a computation device, determination of defect presence in an inspection object on a basis of event data output from an event-based vision sensor that captures an image of the inspection object and detects changes in luminance for each pixel as an event.
A program causing an information processing device to implement:
- performing determination of defect presence in an inspection object on a basis of event data output from an event-based vision sensor that captures an image of the inspection object and detects changes in luminance for each pixel as an event.
Dependencies are inferred from the claim text.