Apparatus and method for measuring 3d shapes of objects using event based camera
AssigneeDenso Wave Incorporated
InventorMasataka TSUJIMOTO
Life of this patent
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AssigneeDenso Wave Incorporated
InventorMasataka TSUJIMOTO
Estimating the term…
A three-dimensional measurement apparatus includes a light projection device projecting a line-shaped light pattern onto an object, an imaging unit two-dimensionally imaging the object, pixel by pixel, at irregular intervals; and a measurement unit measuring a three-dimensional shape of the object based on image data of the object by applying a light-sectioning method to the image data. In the imaging unit, an imaging element has previously set two-dimensional coordinate positions and outputs event data including positive-polarity event data. In the measurement unit, selected positive-polarity event data for the measurement are provided, pixel by pixel, by removing, among the plurality of positive-polarity event data, first positive-polarity event data immediately followed by second positive-polarity event data with a time difference between the first and second positive-polarity event data, the time difference being less than or equal to a predetermined threshold.
A three-dimensional measurement apparatus, comprising:
A three-dimensional measurement method, comprising steps of
A three-dimensional measurement apparatus, comprising:
Dependencies are inferred from the claim text.