System and method for generating semiconductor device models based on retargeted electrical characteristics

A system for generating a semiconductor device model, the system comprising:

• an extraction unit for extracting LUT data including input data and output data of an original semiconductor device by simulating the original semiconductor device under various operating conditions, calculating an electrical characteristic index of the original semiconductor device from the LUT data, and verifying whether an operation of a model based on the LUT data matches an operation of the original semiconductor device;
• a retarget unit for generating retarget LUT data by adjusting the LUT data to satisfy a target electrical characteristic index provided by a user;
• and
• an update unit for determining a final semiconductor device model by comparing an operation simulation result of a model based on the retarget LUT data with the target electrical characteristic index.

A method for generating a semiconductor device model, the method comprising:

• extracting LUT data including input data and output data of an original semiconductor device by simulating the original semiconductor device under various operating conditions;
• calculating an electrical characteristic index of the original semiconductor device from the LUT data;
• generating retarget LUT data by adjusting the LUT data to satisfy a target electrical characteristic index provided by a user;
• and
• determining a final semiconductor device model by comparing an operation simulation result of a model based on the retarget LUT data with the target electrical characteristic index.