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US 2026/0228367 A1Published application
Semiconductor device
AssigneeRenesas Electronics Corporation
InventorsYukihiro KISHIDA, Masashi ASO, Hajime EGUCHI
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Abstract
Enhance the security resistance of semiconductor memory devices against voltage glitches. The glitch detection circuit outputs a glitch detection signal when it detects voltage fluctuations. The post-detection control circuit outputs a reset request signal requesting the reset operation of the semiconductor device or an interrupt request signal for the processing of the processor when the glitch detection signal is output from the glitch detection circuit.
Claims10
A semiconductor device including a processor, comprising:
- a glitch detection circuit that outputs a glitch detection signal when a voltage fluctuation is detected;
- and
- a control circuit that outputs a reset request signal of the semiconductor device or an interrupt request signal for processing of the processor when the glitch detection signal is output from the glitch detection circuit,
- wherein the glitch detection circuit includes a voltage fluctuation detection circuit that outputs a first value in an initial state after reset release and changes the output from the first value to a second value when the voltage fluctuation is detected, and is configured to output the glitch detection signal when the voltage fluctuation detection circuit outputs the second value.
1 more element
Dependencies are inferred from the claim text.