Anomaly detection to classify integrated circuit devices

Abstract

Clone or counterfeit devices can be identified using anomaly detection techniques applied to time series representations of electric signals associated with integrated circuit devices. For example, by analyzing time series electrical waveforms that capture intrinsic device (e.g., semiconductor or circuit) behavior, such techniques can be used to distinguish genuine devices from clones without requiring traditional cryptographic authentication features or associated infrastructure. In addition to, or instead of device authentication, the present subject matter can also be used for anomaly detection in other contexts, such as to detect an indication of anomalous device aging status, or an indication of an anomalous device electrical stress condition.

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