Managing cross-temperature exposure in memory systems
AssigneeMicron Technology, Inc.
InventorGianluca Coppola
Life of this patent
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AssigneeMicron Technology, Inc.
InventorGianluca Coppola
Estimating the term…
Methods, systems, and devices for techniques for managing cross-temperature exposure in memory systems are described. A memory system controller may identify, during a boot sequence, a temperature associated with a write operation at a logical block address (LBA) of a first memory device, where the LBA is associated with a physical address of the first memory device that stores a portion of boot sequence data. The memory system controller may select a read setting based on a difference between an operating temperature of the first memory device during the boot sequence and the temperature associated with the write operation at the LBA of the first memory device. Accordingly, the memory system controller may perform a read operation to read the portion of the boot sequence data from the physical address associated with the LBA according to the read setting.
A memory system, comprising:
A non-transitory computer-readable medium storing code, the code comprising instructions executable by one or more processors of a memory system to:
A method for operating a memory system, comprising:
Dependencies are inferred from the claim text.