US 2026/0227618 A1 · SYSTEM FOR USE IN STRUCTURED ILLUMINATION MICROSCOPY

Abstract

A system for use in structured illumination microscopy (SIM) includes a beam splitter for splitting an input light beam into first and second light beams; a first mirror for reflecting the first light beam back to the beam splitter; and a second mirror for reflecting the second light beam back to the beam splitter. In use, the beam splitter at least partially transmits or reflects the reflected first light beam to form a first output light beam and the beam splitter at least partially transmits or reflects the reflected second light beam to form a second output light beam. One or both of the first and second mirrors includes a micro-electro-mechanical systems (MEMS) mirror, wherein each MEMS mirror is rotatable around a corresponding first axis, each MEMS mirror is rotatable around a corresponding second axis, and each MEMS mirror is configured for translation along a corresponding third axis which is orthogonal to the corresponding first and second axes. A SIM system includes the system for use in SIM and one or more optical sources for generating the input light beam.

Claims25

Dependent claims

A system for use in structured illumination microscopy (SIM), the system comprising:

a beam splitter for splitting an input light beam into first and second light beams,
a first mirror for reflecting the first light beam back to the beam splitter;
and
a second mirror for reflecting the second light beam back to the beam splitter,
wherein the beam splitter at least partially transmits or reflects the reflected first light beam to form a first output light beam and the beam splitter at least partially transmits or reflects the reflected second light beam to form a second output light beam,
wherein one or both of the first and second mirrors comprises a micro-electro-mechanical systems (MEMS) mirror, and
wherein each MEMS mirror is rotatable around a corresponding first axis, each MEMS mirror is rotatable around a corresponding second axis, and each MEMS mirror is configured for translation along a corresponding third axis which is orthogonal to the corresponding first and second axes.

4 more elements

The system as claimed in claim comprising an image sensor arrangement,

wherein the optical coupling arrangement is configured to optically couple the first and second output light beams, or at least two of the first, second, third and fourth main output light beams, to a first side of the sample and to optically couple at least a portion of the generated electromagnetic radiation emitted from the first side of the sample to the image sensor arrangement, or
wherein the optical coupling arrangement is configured to optically couple the first and second output light beams, or at least two of the first, second, third and fourth main output light beams, to a first side of the sample and the system comprises a further optical coupling arrangement for optically coupling at least a portion of the generated electromagnetic radiation emitted from a second side of the sample to the image sensor arrangement, wherein the second side of the sample is opposite to the first side of the sample.

Dependencies are inferred from the claim text.

System for use in structured illumination microscopy

Life of this patent

System for use in structured illumination microscopy

Life of this patent

Abstract

Claims25