Sampling circuit and calibration method therefor, battery management system, and electric device
AssigneeContemporary Amperex Technology Co., Limited
InventorsWeijie CHEN, Fuming YE, Qiandeng LI
Life of this patent
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Abstract
A sampling circuit and a calibration method therefor, a battery management system, and an electric device. The calibration method comprises: acquiring the voltage of a first type sampling point and the voltage of a second type sampling point; on the basis of the voltage of the first type sampling point and the voltage of the second type sampling point, determining a calibration factor corresponding to the first type sampling point; and on the basis of the calibration factor, correcting the voltage of the first type sampling point to obtain the corrected voltage of the first type sampling point.
Claims19
A method for calibrating a sampling circuit, comprising:
- acquiring a voltage at a first-type sampling point and a voltage at a second-type sampling point;
- determining calibration factors corresponding to the first-type sampling point based on the voltage at the first-type sampling point and the voltage at the second-type sampling point;
- and
- correcting the voltage at the first-type sampling point based on the calibration factors to obtain a corrected voltage at the first-type sampling point.
A sampling circuit, comprising:
- a first-type sampling branch, wherein the first-type sampling branch is electrically connected to a device to be tested, and the first-type sampling branch is provided with a first-type voltage divider module and a first-type sampling point;
- a second-type sampling branch, wherein the second-type sampling branch is electrically connected to the device to be tested, and the second-type sampling branch is provided with a second-type voltage divider module, a switch module, and a second-type sampling point;
- and
- a sampling and processing module, wherein the sampling and processing module is electrically connected to the first-type sampling point and the second-type sampling point, respectively, the sampling and processing module is configured to correct a voltage at the first-type sampling point based on calibration factors, and the calibration factors are determined based on the voltage at the first-type sampling point and a voltage at the second-type sampling point.
Dependencies are inferred from the claim text.