Inspection device, inspection method, and method for manufacturing battery

An inspection device, comprising:

• an acquisitor configured to acquire data obtained from an inspection target;
• and
• a processor configured to perform a first operation to process the data acquired by the acquisitor,
• the data including
• a first magnetic field data related to a first plane, and
• a third magnetic field data related to a third plane,
• the first plane being along a first direction and a second direction crossing the first direction,
• the third plane being along the first direction and the second direction,
• the inspection target being between the first plane and the third plane,
• the first plane including a first region and a first other region,
• a direction from the first region to the first other region being along the first direction,
• the first magnetic field data including a first region data related to the first region and a first other region data related to the first other region,
• the processor being configured to inspect the inspection target based on derived data in the first operation,
• the derived data including:
• a first inspection data including a first difference between the first region data and a first other region inverted data obtained by inverting a first other magnetic field value included in the first other region data in the first direction, and
• a third inspection data based on the third magnetic field data.

An inspection method, comprising:

• acquiring data obtained from an inspection target;
• processing the data,
• the data including
• a first magnetic field data related to a first plane,
• and
• a second magnetic field data related to a second plane,
• the first plane being along a first direction and a second direction crossing the first direction,
• the second plane being along the second direction and a third direction or along the first direction and the second direction,
• the third direction crossing a plane including the first direction and the second direction,
• the first plane including a first region and a first other region,
• a direction from the first region to the first other region being along the first direction,
• the first magnetic field data including a first region data related to the first region and a first other region data related to the first other region;
• and
• inspecting the inspection target based on a derived data;
• the derived data including:
• a first inspection data including a first difference between the first region data and a first other region inverted data obtained by inverting a first other magnetic field value included in the first other region data in the first direction, and
• a second inspection data based on the second magnetic field data.