Inspection device, inspection method, and method for manufacturing battery
AssigneeKabushiki Kaisha Toshiba
InventorsYoshihiro HIGASHI, Akira KIKITSU, Satoshi SHIROTORI
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Abstract
According to one embodiment, an inspection device includes an acquisitor configured to acquire data obtained from an inspection target, and a processor configured to perform a first operation of processing the data acquired by the acquisitor. The data includes a first magnetic field data represented by a first coordinate in a first direction and a second coordinate in a circumferential direction around a first axis along the first direction. The processor is configured to inspect the inspection target based on a first inspection data based on the first magnetic field data in the first operation.
Claims20
An inspection device, comprising:
- an acquisitor configured to acquire data obtained from an inspection target;
- and
- a processor configured to perform a first operation of processing the data acquired by the acquisitor,
- the data including a first magnetic field data represented by a first coordinate in a first direction and a second coordinate in a circumferential direction around a first axis along the first direction, and
- the processor being configured to inspect the inspection target based on a first inspection data based on the first magnetic field data in the first operation.
An inspection method, comprising:
- acquiring data obtained from an inspection target;
- processing the data, the data including a first magnetic field data represented by a first coordinate in a first direction and a second coordinate in a circumferential direction around a first axis along the first direction;
- and
- inspecting the inspection target based on a first inspection data based on the first magnetic field data.
Dependencies are inferred from the claim text.