Analysis device and method for determining presence or absence of abnormality
AssigneeHitachi High-Tech Corporation
InventorsTakashi SAEGUSA, Hikaru KARO, Toshiyuki INABE
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AssigneeHitachi High-Tech Corporation
InventorsTakashi SAEGUSA, Hikaru KARO, Toshiyuki INABE
Estimating the term…
To provide an analyzing apparatus and a method of determining an abnormality capable of detecting abnormalities including defects and deterioration of replaceable components based on a potential difference generated between an ion selective electrode and a reference electrode, in an analyzing apparatus that measures a concentration of electrolytes in a sample, a waveform acquisition unit associates the acquired waveforms with each of driving timings, detects a peak of a waveform that appears in temporal vicinity of the driving timing, and calculates a feature amount. Here, the feature amount includes at least one of the electromotive force at the peak or a time period between a time of the driving timing and a time of occurrence of the peak. Then, the waveform analyzing unit determines an abnormality based on the feature amount.
1-6. (canceled)
An analyzing apparatus that measures a concentration of electrolytes in a sample, the analyzing apparatus comprising:
A method of determining an abnormality in an analyzing apparatus that measures a concentration of electrolytes in a sample, the analyzing apparatus including,
Dependencies are inferred from the claim text.