Die cutting and slitting system, and visual inspection method for die cutting and slitting

A control system for a die cutting and slitting system, wherein the system comprises an inner electrode plate inspection mechanism, an outer electrode plate inspection mechanism, an upper computer, and a conveying apparatus;

• controls the conveying apparatus to transport an inner electrode plate to pass through the inner electrode plate inspection mechanism;
• controls the conveying apparatus to transport an outer electrode plate to pass through the outer electrode plate inspection mechanism;
• controls the inner electrode plate inspection mechanism to acquire first image information of the inner electrode plate;
• controls the outer electrode plate inspection mechanism to acquire second image information of the outer electrode plate;
• sends the first image information and the second image information to the upper computer, such that the upper computer performs quality inspection according to the first image information and the second image information, to obtain an inspection result.

A visual inspection method for die cutting and slitting, wherein the method is applied to a die cutting and slitting system, and the system comprises an inner electrode plate inspection mechanism, an outer electrode plate inspection mechanism, a conveying apparatus, and an upper computer;

• the conveying apparatus transports an inner electrode plate to pass through the inner electrode plate inspection mechanism, and the conveying apparatus transports an outer electrode plate to pass through the outer electrode plate inspection mechanism;
• the visual inspection method for die cutting and slitting comprises:
• the upper computer being configured to acquire first image information and second image information;
• performing quality inspection according to the first image information and the second image information, wherein the first image information is an image acquired by the inner electrode plate inspection mechanism, and the second image information is an image acquired by the outer electrode plate inspection mechanism.