Method and test system for testing a device-under-test
AssigneeRohde & Schwarz GmbH & Co. KG
InventorMichael DREIMANN
Life of this patent
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Abstract
The present disclosure relates to a method for testing a device-under-test, DUT. The method comprises: connecting the DUT to a test system; and retrieving a test profile for testing the DUT with the test system; wherein the step of retrieving the test profile comprises reading a two-dimensional code which is located on or displayed by the DUT, wherein the test profile is associated to the two-dimensional code; and wherein the test system is configured according to the retrieved test profile in order to test the DUT.
Claims10
A method for testing a device-under-test, DUT, comprising:
- connecting the DUT to a test system;
- and
- retrieving a test profile for testing the DUT with the test system;
- wherein the step of retrieving the test profile comprises reading a two-dimensional code which is located on or displayed by the DUT, wherein the test profile is associated to the two-dimensional code;
- and
- wherein the test system is configured according to the retrieved test profile in order to test the DUT.
A test system for testing a device-under-test, DUT, comprising:
- an interface which is arranged for being connected to the DUT;
- and
- a reading device;
- wherein the test system is configured to retrieve a test profile for testing the DUT;
- wherein the retrieval of the test profile comprises reading a two-dimensional code which is located on or displayed by the DUT by means of the reading device, wherein the test profile is associated to the two-dimensional code;
- and
- wherein the test system is adapted to be configured according to the retrieved test profile in order to test the DUT.
Dependencies are inferred from the claim text.